5
Publications
122
Citations
5
H-Index
2018
Active since
Affiliations
Yuan Zhong is an author at National Institute of Metrology specializing in engineering, microelectronics, and computer engineering.
Top concepts
EngineeringMicroelectronicsChemistryThin FilmsVlsi DesignNanotechnologyApplied PhysicsNanoelectronicsSurface ScienceMaterial Science
Publications per year
2018–2021
5
5
New Insights into the Physical Origin of Negative Capacitance and Hysteresis in NCFETs
Huimin Wang, Mengxuan Yang, Qianqian Huang et al. · 2018 · 56 citations
Study of DC Magnetron Sputtered Nb Films
He Gao, Shijian Wang, Da Xu et al. · Crystals · 2021 · 10 citations · Full text
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