Patrice Besse

Area-efficient, reduced and no-snapback PNP-based ESD protection in advanced Smart Power technology

Amaury Gendron, C. Salamero, M. Bafleur et al. · 2006 · 20 citations

Low-power Electronics, Electrical Engineering, No-snapback Components +10

TCAD Methodology for ESD Robustness Prediction of Smart Power ESD Devices

C. Salamero, Nicolas Nolhier, Amaury Gendron et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 15 citations

Engineering, Power Optimization (Eda), Power Electronics +17

ESD system level characterization and modeling methods applied to a LIN transceiver

Patrice Besse, Fréderic Lafon, Nicolas Monnereau et al. · 2011 · 14 citations

Lin Transceiver, Electrical Engineering, Physical Design (Electronics) +15

Correlation between system level and TLP tests applied to stand-alone ESD protections and commercial products

Patrice Besse, Jean-Philippe Laine, Alain Salles et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2010 · 11 citations

Reliability, Electrical Engineering, Reliability Engineering +15

Investigation for a Smart Power and self-protected device under ESD stress through geometry and design considerations for automotive applications

Patrice Besse, Nicolas Nolhier, Marise Bafleur et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2002 · 10 citations

Electrical Engineering, Engineering, Device Reliability +11