Satoshi Urakawa - Concepedia

Author

Satoshi Urakawa

Nara Institute of Science and Technology ORCID

Also Known As

S. Urakawa, Satoshi URAKAWA, Satoshi Urakawa

Publications

228

Citations

H-Index

Concepts

All Affiliations

Nara Institute of Science and Technology Kochi University of Technology Idemitsu Kosan (Japan)Japan Science and Technology Agency

About

Satoshi Urakawa is an author at Nara Institute of Science and Technology specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	218
2	Applied Physics	6	6	218
3	Electrical Engineering	5	5	193
4	Materials Science	5	5	205
5	Electronic Devices	2	2	52

Satoshi Urakawa

Publications

218

Citations

H-Index

Page 1

	Year	Citations
Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect Satoshi Urakawa, Shigekazu Tomai, Yoshihiro Ueoka, Applied Physics Letters EngineeringThin-film TransistorHot Carrier EffectSemiconductor DeviceNanoelectronics	2013	89
Effect of contact material on amorphous InGaZnO thin-film transistor characteristics Yoshihiro Ueoka, Yasuaki Ishikawa, Juan Paolo Bermundo, Japanese Journal of Applied Physics EngineeringSemiconductor DeviceSemiconductorsElectronic DevicesAg Electrodes	2014	41
Density of States in Amorphous In-Ga-Zn-O Thin-Film Transistor under Negative Bias Illumination Stress Yoshihiro Ueoka, Yasuaki Ishikawa, Juan Paolo Bermundo, ECS Journal of Solid State Science and Technology Materials ScienceElectrical EngineeringBias StressEngineeringNanoelectronics	2014	39
Analysis of electronic structure of amorphous InGaZnO/SiO2 interface by angle-resolved X-ray photoelectron spectroscopy Yoshihiro Ueoka, Yasuaki Ishikawa, Naoyuki Maejima, Journal of Applied Physics Materials ScienceIi-vi SemiconductorEngineeringNanoelectronicsOxide Electronics	2013	25
Thermal analysis for observing conductive filaments in amorphous InGaZnO thin film resistive switching memory Keisuke Kado, Mutsunori Uenuma, Sharma Kriti, Applied Physics Letters EngineeringPhase Change MemoryConductive FilamentsElectrical PathMemory	2014	13
Thermal distribution in amorphous InSnZnO thin‐film transistor Satoshi Urakawa, Shigekazu Tomai, Yoshihiro Ueoka, Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics Materials ScienceElectrical EngineeringElectronic DevicesEngineeringElectronic Materials	2013	11

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