Leander Baier

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Active since

2023

Affiliations

Friedrich-Alexander-Universität Erlangen-Nürnberg(Current)

Fraunhofer Institute for Integrated Systems and Device Technology

Leander Baier is an author at Friedrich-Alexander-Universität Erlangen-Nürnberg specializing in atomic force microscopy, optical reflectance, and birefringence analysis.

Publications per year

2023–2024

Publications

A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C

Alexander May, Mathias Rommel, Leander Baier et al. · 2024 · 15 citations

Engineering, Electrical Engineering, Microelectronics +16

Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials

Julian Schwarz, Michael Niebauer, Maria Koleśnik‐Gray et al. · Small Methods · 2023 · 10 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

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