John D’Amico

The Present Status and Recent Advancements in Corona-Kelvin Non-Contact Electrical Metrology of Dielectrics for IC-Manufacturing

Marshall Wilson, Dmitriy Marinskiy, Anton Byelyayev et al. · ECS Transactions · 2006 · 52 citations

Engineering, Measurement, Education +23

Mossbauer Study of Tin(II) Sensitizer Deposits on Kapton

Richard L. Cohen, John D’Amico, K. W. West · Journal of The Electrochemical Society · 1971 · 49 citations

Selective Electroless Metal Deposition Using Patterned Photo-Oxidation of Sn(II) Sensitized Substrates

John D’Amico, M. A. De Angelo, J. F. Henrickson et al. · Journal of The Electrochemical Society · 1971 · 33 citations

Engineering, Chemistry, Chemical Deposition +17

Laser drilling of microvias in epoxy-glass printed circuit boards

A. Kestenbaum, John D’Amico, B. J. Blumenstock et al. · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1990 · 29 citations

Laser Processing (Laser Material Processing), Engineering, Mechanical Engineering +17

Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

Marshall Wilson, Piotr Edelman, Alexandre Savtchouk et al. · Journal of Electronic Materials · 2010 · 21 citations

Electrical Engineering, Photoluminescence, Engineering +11