Al V Bykov is an author at Southern Federal University specializing in nanotechnology, applied physics, and instrumentation.
Top concepts
MicroscopyEngineeringNanotechnologyApplied PhysicsInstrumentationIon Beam PhysicsMaterial ScienceMicrofabrication
Publications per year
2015–2018
2
2
Atomic Force Microscopy Measurement of the Resistivity of Semiconductors
V. A. Smirnov, R V Tominov, N. I. Alyab’eva et al. · Technical Physics · 2018 · 12 citations
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