Statistics
Publications
2
Citations
50
H-Index
2
Active since
2018
Affiliations
Dalian University of Technology(Current)
Yinnan Li is an author at Dalian University of Technology specializing in semiconductor reliability, electronic materials, and polar remote sensing.
Publications per year
2018–2018
2
2
Formation of subsurface cracks in silicon wafers by grinding
Jingfei Yin, Qian Bai, Yinnan Li et al. · Nanotechnology and Precision Engineering · 2018 · 36 citations · Full text
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