Stefan Wiefels - Concepedia

Author

Stefan Wiefels

RWTH Aachen University ORCID

Also Known As

S. Wiefels, Stefan Wiefels, Wiefels, Stefan

Publications

871

Citations

H-Index

Concepts

All Affiliations

RWTH Aachen University Forschungszentrum Jülich Jülich Aachen Research Alliance Delft University of Technology Infineon Technologies (Germany)

About

Stefan Wiefels is an author at RWTH Aachen University specializing in engineering, electrical engineering, and computer architecture.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	301
2	Computer Engineering	6	6	131
3	Applied Physics	4	4	188
4	Chemical Engineering	1	1	97
5	Computer Science	1	1	16

Stefan Wiefels

Publications

547

Citations

H-Index

Page 1

	Year	Citations
Interfacial Metal–Oxide Interactions in Resistive Switching Memories Deok‐Yong Cho, Michael Luebben, Stefan Wiefels, ACS Applied Materials & Interfaces	2017	122
Processes and Effects of Oxygen and Moisture in Resistively Switching TaO<i><sub>x</sub></i> and HfO<i><sub>x</sub></i> Michael Lübben, Stefan Wiefels, Rainer Waser, Advanced Electronic Materials EngineeringOxidation ResistanceEmerging Memory TechnologyChemical EngineeringElectronic Devices	2017	97
Roadmap to neuromorphic computing with emerging technologies Adnan Mehonić, Daniele Ielmini, Kaushik Roy, APL Materials	2024	81
HRS Instability in Oxide-Based Bipolar Resistive Switching Cells Stefan Wiefels, Christopher Bengel, Nils Kopperberg, IEEE Transactions on Electron Devices Non-volatile MemoryEngineeringEmerging Memory TechnologyComputer ArchitecturePhase Change Memory	2020	53
Impact of the Ohmic Electrode on the Endurance of Oxide-Based Resistive Switching Memory Stefan Wiefels, Moritz von Witzleben, Michael Hüttemann, IEEE Transactions on Electron Devices Materials EngineeringNon-volatile MemoryElectrical EngineeringEngineeringNanoelectronics	2021	37
A Consistent Model for Short-Term Instability and Long-Term Retention in Filamentary Oxide-Based Memristive Devices Nils Kopperberg, Stefan Wiefels, Sergej Liberda, ACS Applied Materials & Interfaces	2021	33
Reliability aspects of binary vector-matrix-multiplications using ReRAM devices Christopher Bengel, Johannes Mohr, Stefan Wiefels, Neuromorphic Computing and Engineering EngineeringMemristive DevicesEmerging Memory TechnologyReliability AspectsComputer Architecture	2022	29
Effect of electron conduction on the read noise characteristics in ReRAM devices Kristoffer Schnieders, Carsten Funck, Felix Cüppers, APL Materials EngineeringPhase Change MemoryRead VariabilitySemiconductor DeviceIonic Noise	2022	20
A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs Mahta Mayahinia, Abhairaj Singh, Christopher Bengel, ACM Journal on Emerging Technologies in Computing Systems Non-volatile MemoryElectrical EngineeringEngineeringVlsi DesignVlsi Architecture	2022	18
Reliability Aspects of 28 nm BEOL‐Integrated Resistive Switching Random Access Memory Stefan Wiefels, Nils Kopperberg, Karl Hofmann, physica status solidi (a) Non-volatile MemoryEngineeringEmerging Memory TechnologyReliability AspectsComputer Architecture	2023	18

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