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Jaerd Bowman

JB

Statistics

Publications

2

Citations

151

H-Index

2

Active since

2005

Affiliations

Vanderbilt University(Current)

BAE Systems (United States)

Jaerd Bowman is an author at Vanderbilt University specializing in synchrotron radiation, single event effects, and dosimetry.

Top concepts

Publications per year

2005–2007

2

Publications

2

Impact of Ion Energy and Species on Single Event Effects Analysis

Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2007 · 117 citations

, , +15

Single-event upset in flip-chip SRAM induced by through-wafer, two-photon absorption

Dale McMorrow, William T. Lotshaw, Joseph S. Melinger et al. · IEEE Transactions on Nuclear Science · 2005 · 34 citations

, , +17

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