Concepedia

Takayuki Shingyouji

TS

Statistics

Publications

9

Citations

211

H-Index

9

Active since

1993

Affiliations

Mitsubishi Materials (Japan)(Current)

Mitsubishi Group (Japan)

Central Research Institute

Takayuki Shingyouji is an author at Mitsubishi Materials (Japan) specializing in materials science, engineering, and semiconductor materials.

Publications per year

1993–1999

9

Publications

9

Separation and analysis of diffusion and generation components of <i>pn</i> junction leakage current in various silicon wafers

Yoshio Murakami, Takayuki Shingyouji · Journal of Applied Physics · 1994 · 85 citations

, , +17

Degradation of dielectric breakdown field of thermal SiO2 films due to structural defects in Czochralski silicon substrates

Y. Satoh, T. Shiota, Yoshio Murakami et al. · Journal of Applied Physics · 1996 · 27 citations

, , +17

Effects of oxygen-related defects on the leakage current of silicon p/n junctions

Yoshio Murakami, Y. Satoh, Hisashi Furuya et al. · Journal of Applied Physics · 1998 · 20 citations

, , +17

Effect of bulk microdefects induced in heat-treated Czochralski silicon on dielectric breakdown of thermal SiO2 films

Y. Satoh, Yoshio Murakami, Hidemine Furuya et al. · Applied Physics Letters · 1994 · 17 citations

, , +16

Effect of oxidation ambient on the dielectric breakdown characteristics of thermal oxide films of silicon

Yoshio Murakami, T. Shiota, Takayuki Shingyouji et al. · Journal of Applied Physics · 1994 · 15 citations

, , +17

1–5 of 9