Sharpened electron beam deposited tips for high resolution atomic force microscope lithography and imaging

M. Wendel, H. Lorenz, J. P. Kotthaus

Applied Physics Letters

EngineeringElectron-beam LithographyMicroscopyOptoelectronic DevicesSharp Tips +14

Nanolithography with an atomic force microscope for integrated fabrication of quantum electronic devices

M. Wendel, Stephen J. Kuhn, H. Lorenz, +2

Applied Physics Letters

EngineeringElectron-beam LithographyMicroscopyNanocomputingBeam Lithography +20

Direct patterning of surface quantum wells with an atomic force microscope

J. Cortes Rosa, M. Wendel, H. Lorenz, +3

Applied Physics Letters

Direct PatterningAtomic Force MicroscopyEngineeringElectron-beam LithographyMicroscopy +17

Percolation Metal-Insulator Transitions in the Two-Dimensional Electron System of AlGaAs/GaAs Heterostructures

A. A. Shashkin, V. T. Dolgopolov, G. V. Kravchenko, +8

Physical Review Letters

EngineeringStrongly Correlated Electron SystemsMetal-insulator Phase DiagramPercolation Metal-insulator TransitionQuantum Materials +16

Nanolithography with an atomic force microscope

M. Wendel, Bernd Irmer, J. Cortes, +5

Superlattices and Microstructures

Materials ScienceEngineeringBeam LithographyMicrofabricationNanotechnology +7

Interlaboratory comparison measurements of aspheres

Reyko Schachtschneider, Ines Fortmeier, Manuel Stavridis, +18

Measurement Science and Technology

GeophysicsSensor CalibrationUpper AtmosphereInterlaboratory Comparison MeasurementsEngineering +13

One-dimensional transport of electrons in Si/Si0.7Ge0.3 heterostructures

Markus Holzmann, D. Többen, G. Abstreiter, +4

Applied Physics Letters

SemiconductorsQuantum ScienceSemiconductor TechnologyEngineeringPhysics +11

Extraction of shape and roughness using scattering light

Jörg Seewig, Günter Beichert, R. Brodmann, +2

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringMeasurementEducationWhite LightCoherent Gradient Sensing +15

Oxidation of quasicrystalline and crystalline AlCuFe thin films in air

A. Haugeneder, T. Eisenhammer, Alexander Mahr, +2

Thin Solid Films

Materials ScienceEngineeringOxidation ResistanceOxide ElectronicsSurface Science +4

Fast optical 3D form measurement of aspheres including determination of thickness and wedge and decenter errors

Edward Stover, G. Berger, M. Wendel, +1

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringOptical TestingFast Optical 3DInterferometryOptical Metrology +15