F.P. Adams

A System for Rapid Measurements of RF and Microwave Properties Up to 1400°C. Part1: Theoritical Development of the Cavity Frequency-Shift Data Analysis Equations

R. M. Hutcheon, M. de Jong, F.P. Adams · Journal of Microwave Power and Electromagnetic Energy · 1992 · 55 citations

RF and Microwave Dielectric Measurements to 1400°C and Dielectric Loss Mechanisms

R. M. Hutcheon, M.S. de Jong, F.P. Adams et al. · MRS Proceedings · 1992 · 42 citations

Electrical Engineering, Engineering, Dielectric Loss Mechanisms +9

A System for Rapid Measurements of RF and Microwave Properties Up to 1400°C. Part 2: Description of Apparatus, Data Collection Techniques and Measurements on Selected Materials.

R. M. Hutcheon, M. de Jong, F.P. Adams et al. · Journal of Microwave Power and Electromagnetic Energy · 1992 · 35 citations

Rf Devices, Engineering, Data Collection Techniques +24

Sample Shape Correction Factors for Cavity Perturbation Measurements

F.P. Adams, M. de Jong, R. M. Hutcheon · Journal of Microwave Power and Electromagnetic Energy · 1992 · 27 citations

Engineering, Measurement, Accuracy And Precision +17

Nondestructive single-shot soft x-ray lithography and contact microscopy using a laser-produced plasma source

R. J. Rosser, R. Feder, A. Ng et al. · Applied Optics · 1987 · 12 citations

Engineering, Electron-beam Lithography, Microscopy +18