Concepedia

Ga Zhang

GZ

1

Publications

17

Citations

1

H-Index

2024

Active since

Affiliations

China Electronic Product Reliability and Environmental Test Institute(Current)

Ga Zhang is an author at China Electronic Product Reliability and Environmental Test Institute.

ORCID

Publications per year

2024–2024

1

Publications

1

TCAD Simulation of the Effect of Buffer Layer Parameters on Single Event Burn-Out in p-GaN Gate HEMTs

Ga Zhang, Shenglei Zhao, Zhizhe Wang et al. · IEEE Transactions on Electron Devices · 2024 · 17 citations

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