P. Pirouz

Growth defects in GaN films on sapphire: The probable origin of threading dislocations

X. J. Ning, F. R. Chien, P. Pirouz et al. · Journal of materials research/Pratt's guide to venture capital sources · 1996 · 326 citations

Natural Sciences, Materials Engineering, Materials Science +15

Recombination-enhanced extension of stacking faults in 4H-SiC <i>p-i-n</i> diodes under forward bias

Augustinas Galeckas, Jan Linnros, P. Pirouz · Applied Physics Letters · 2002 · 206 citations

Engineering, Electrical Engineering, Materials Science +17

The microstructure of SCS-6 SiC fiber

X. J. Ning, P. Pirouz · Journal of materials research/Pratt's guide to venture capital sources · 1991 · 203 citations

Natural Sciences, Materials Engineering, Materials Science +12

Polytypic transformations in SiC: the role of TEM

P. Pirouz, J. Yang · Ultramicroscopy · 1993 · 198 citations

Natural Sciences, Materials Engineering, Materials Science +11

Stacking fault energy of 6H-SiC and 4H-SiC single crystals

M. H. Hong, A. V. Samant, P. Pirouz · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 2000 · 183 citations

Natural Sciences, Materials Engineering, Materials Science +12