A. Ciszewski

Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering

R. Wasielewski, J. Domaradzki, Damian Wojcieszak et al. · Applied Surface Science · 2008 · 53 citations

Materials Science, Surface Characterization, Engineering +8

Oxidation of GaN(0001) by low-energy ion bombardment

M. Grodzicki, P. Mazur, S. Zuber et al. · Applied Surface Science · 2013 · 40 citations

Chemical Engineering, Engineering, Applied Physics +2

Influence of annealing on the structure and stoichiometry of europium-doped titanium dioxide thin films

J. Domaradzki, Danuta Kaczmarek, A. Borkowska et al. · Vacuum · 2008 · 39 citations

Materials Engineering, Materials Science, Material Analysis +6

A comparison of adsorbate-induced faceting on flat and curved crystal surfaces

Andrzej Szczepkowicz, A. Ciszewski, Robert Bryl et al. · Surface Science · 2005 · 31 citations

Materials Science, Surface Characterization, Engineering +10

Changes of electronic properties of p-GaN(0 0 0 1) surface after low-energy N+-ion bombardment

M. Grodzicki, P. Mazur, A. Ciszewski · Applied Surface Science · 2018 · 28 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +8