R. Wasielewski

Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering

R. Wasielewski, J. Domaradzki, Damian Wojcieszak et al. · Applied Surface Science · 2008 · 53 citations

Materials Science, Surface Characterization, Engineering +8

Influence of annealing on the structure and stoichiometry of europium-doped titanium dioxide thin films

J. Domaradzki, Danuta Kaczmarek, A. Borkowska et al. · Vacuum · 2008 · 39 citations

Materials Engineering, Materials Science, Material Analysis +6

Carbon accumulation and mitigation processes, and secondary electron yields of ruthenium surfaces

B. V. Yakshinskiy, R. Wasielewski, Elena Loginova et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 29 citations

Engineering, Vacuum Device, Chemistry +21

Fabrication of submicron-sized features in InP/InGaAsP/AlGaInAs quantum well heterostructures by optimized inductively coupled plasma etching with Cl2/Ar/N2 chemistry

Rafal Dylewicz, R.M. De La Rue, R. Wasielewski et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 20 citations

Aluminium Nitride, Engineering, Electron-beam Lithography +19

Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy

Danuta Kaczmarek, J. Domaradzki, Damian Wojcieszak et al. · Applied Surface Science · 2008 · 19 citations

Materials Science, Atomic Force Microscopy, Material Analysis +10