Concepedia

Michael Schroth

MS

Statistics

Publications

1

Citations

23

H-Index

1

Active since

1997

Affiliations

Bruce Technologies (United States)(Current)

Michael Schroth is an author at Bruce Technologies (United States) specializing in materials characterization, thin film surface roughness, and surface roughness.

Publications per year

1997–1997

1

Publications

1

Characterization of the low-pressure chemical vapor deposition grown rugged polysilicon surface using atomic force microscopy

Y. E. Strausser, Michael Schroth, John J. Sweeney · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1997 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +17

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