Concepedia
Statistics
Publications
6
Citations
163
H-Index
Active since
1980
Affiliations
Yale University(Current)
University of California, Irvine
IBM Research - Thomas J. Watson Research Center
M. R. Chin is an author at Yale University specializing in materials science, electrical engineering, and electronic materials.
Publications per year
1980–1993
Gate-width dependence of radiation-induced interface traps in metal/SiO2/Si devices
M. R. Chin, T. P. · Applied Physics Letters · 1983 · 69 citations
Engineering, Materials Engineering, Materials Science +17
rf annealing mechanisms in metal-oxide-semiconductor structures—an experimental simulation
T. P., M. R. Chin · Journal of Applied Physics · 1980 · 30 citations
Natural Sciences, Electrical Engineering, Materials Science +17
Removal of radiation-induced electron traps in MOS structures by rf annealing
TERESA GEORGE P., M. R. Chin · Applied Physics Letters · 1980 · 18 citations
Natural Sciences, Electrical Engineering, Materials Science +14
Resolving the mechanisms of current gain increase under forward current stress in poly emitter n-p-n transistors
Jie Zhao, G.P. Li, Kai Liao et al. · IEEE Electron Device Letters · 1993 · 18 citations
Engineering, Electrical Engineering, Materials Science +17
On the effects of hydrogen in p-n-p transistors under forward current stress in a C-BiCMOS technology
Jie Zhao, G.P. Li, Kai Liao et al. · IEEE Electron Device Letters · 1993 · 17 citations
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