T. W. Kim

Microstructural, electrical, and optical properties of SnO2 nanocrystalline thin films grown on InP (100) substrates for applications as gas sensor devices

T. W. Kim, D. U. Lee, Young Soo Yoon · Journal of Applied Physics · 2000 · 174 citations

Natural Sciences, Materials Engineering, Materials Science +17

Structural properties and interfacial layer formation mechanisms of PbTiO3 thin films grown on <i>p</i>-Si substrates

T. W. Kim, Young Soo Yoon, Sue S. Yom et al. · Applied Physics Letters · 1994 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17

Structural, electrical, and optical properties of SnO2 nanocrystalline thin films grown on <i>p</i>-InSb (111) substrates

T. W. Kim, D. U. Lee, J. H. Lee et al. · Journal of Applied Physics · 2001 · 36 citations

Natural Sciences, Materials Science, Physics +17

Structural properties of BaTiO3 thin films on Si grown by metalorganic chemical vapor deposition

Young Soo Yoon, W. N. Kang, Hyogeun Shin et al. · Journal of Applied Physics · 1993 · 35 citations

Natural Sciences, Materials Engineering, Materials Science +17

Interdiffusion problems at CdTe/InSb heterointerfaces grown by temperature gradient vapor transport deposition

T. W. Kim, Mina Jung, H. L. Park et al. · Applied Physics Letters · 1992 · 32 citations

Engineering, Materials Engineering, Materials Science +17