Erik Strub

Optical properties and structure of HfO₂thin films grown by high pressure reactive sputtering

F. L. Martı́nez, M. Toledano-Luque, J.J. Gandı́a et al. · Journal of Physics D Applied Physics · 2007 · 184 citations · Full text

Determination of the band gap depth profile of the penternary Cu(In(1−X)GaX)(SYSe(1−Y))2 chalcopyrite from its composition gradient

Marcus Bär, W. Bohne, J. Röhrich et al. · Journal of Applied Physics · 2004 · 171 citations

Optical Materials, Engineering, Eg Profile +19

Experiment and simulation of the compositional evolution of Ti–B thin films deposited by sputtering of a compound target

J. Neidhardt, Stanislav Mráz, Jochen M. Schneider et al. · Journal of Applied Physics · 2008 · 167 citations

Materials Science, Ti–b Thin Films, Engineering +15

Indium sulfide thin films deposited by the spray ion layer gas reaction technique

N. Allsop, Antje Schönmann, Abdelhak Belaidi et al. · Thin Solid Films · 2006 · 64 citations

Materials Science, Engineering, Surface Science +6

Characterization of p-CuI prepared by the SILAR technique on Cu-tape/n-CuInS2 for solar cells

Babasaheb R. Sankapal, A. Ennaoui, T. Guminskaya et al. · Thin Solid Films · 2004 · 62 citations

Materials Science, Engineering, Organic Solar Cell +5