S. Mukhopadhyay

Reliable and self-repairing sram in nano-scale technologies using leakage and delay monitoring

S. Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi et al. · 2006 · 45 citations

Engineering, Vlsi Design, Computer Architecture +18

Speed binning aware design methodology to improve profit under parameter variations

A. Datta, Swarup Bhunia, Jung Hwan Choi et al. · Asia and South Pacific Conference on Design Automation, 2006. · 2006 · 21 citations

Mathematical Programming, Aware Design Methodology, Engineering +26

Double-gate SOI devices for low-power and high-performance applications

K. Roy, Hamid Mahmoodi, S. Mukhopadhyay et al. · ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. · 2005 · 17 citations

Low-power Electronics, Electrical Engineering, Engineering +10

Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling

S. Mukhopadhyay, A. Raychowdhury, K. Roy · Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) · 2004 · 15 citations

Device Modeling, Junction Btbt Leakage, Electrical Engineering +14

Leakage in nanometer scale CMOS circuits

S. Mukhopadhyay, Hamid Mahmoodi, C. Neau et al. · 2004 · 13 citations

Hardware Security, Low-power Electronics, Electrical Engineering +13