Jeanne Paulette Bickford

Statistical Evaluation of Electromigration Reliability at Chip Level

Baozhen Li, P. McLaughlin, Jeanne Paulette Bickford et al. · IEEE Transactions on Device and Materials Reliability · 2010 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +17

DATE 2006 Special Session: DFM/DFY Design for Manufacturability and Yield - influence of process variations in digital, analog and mixed-signal circuit design

Andreas Ripp, M. Bühler, J. Koehl et al. · 2006 · 26 citations

Engineering, Digital Design, Electrical Engineering +17

Yield Improvement by Local Wiring Redundancy

Jeanne Paulette Bickford, Jason Hibbeler, M. Bühler et al. · 2006 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +14

Product Yield Prediction System and Critical Area Database

T.S. Barnett, Jeanne Paulette Bickford, Alan J. Weger · IEEE Transactions on Semiconductor Manufacturing · 2008 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17

SRAM Redundancy - Silicon Area versus Number of Repairs Trade-off

Jeanne Paulette Bickford, R.J. Rosner, Erik Hedberg et al. · ASMC proceedings · 2008 · 13 citations

Engineering, Computer Engineering, Computer Science +17