A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Jakub Szlachetko, Maarten Nachtegaal, E. de Boni, +13

Review of Scientific Instruments

Physical Mechanisms and Scaling Laws of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-Shell Double Photoionization

J. Hoszowska, A. S. Kheifets, J.‐Cl. Dousse, +8

Physical Review Letters

X-ray SpectroscopyEngineeringChemistrySynchrotron Radiation SourceMath Xmlns +14

In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials

Jakub Szlachetko, Jacinto Sá, Оlga V. Safonova, +4

Journal of Electron Spectroscopy and Related Phenomena

X-ray CrystallographyMaterials ScienceDynamic ChangesX-ray SpectroscopyEngineering +5

High-Resolution Study of X-Ray Resonant Raman Scattering at the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>Edge of Silicon

Jakub Szlachetko, J.‐Cl. Dousse, J. Hoszowska, +6

Physical Review Letters

Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1keV and 18keV

Jakub Szlachetko, J.‐Cl. Dousse, J. Hoszowska, +4

Review of Scientific Instruments

High-resolution Laue-type DuMond curved crystal spectrometer

M. Szlachetko, M. Berset, J.‐Cl. Dousse, +2

Review of Scientific Instruments

X-ray CrystallographyX-ray SpectroscopyEngineeringSpectrochemical AnalysisX-ray Imaging +15

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology

Jakub Szlachetko, D. Banaś, A. Kubala‐Kukuś, +9

Journal of Applied Physics

X-ray SpectroscopyEngineeringMicroscopySemiconductor NanotechnologyX-ray Fluorescence +19

Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation

A. Kubala‐Kukuś, D. Banaś, Wei Cao, +8

Physical Review B

Materials ScienceAluminium NitrideEmission X-ray FluorescenceSurface CharacterizationX-ray Spectroscopy +13

Double<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-shell ionization of Al induced by photon and electron impact

K. Fennane, J.-Cl. Dousse, J. Hoszowska, +6

Physical Review A

X-ray SpectroscopyNuclear PhysicsEngineeringIon Beam InstrumentationMetallic Aluminum +18

A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

P. Jagodziński, Jakub Szlachetko, J.‐Cl. Dousse, +10

Review of Scientific Instruments

X-ray SpectroscopyEngineeringChemistryDumond GeometrySynchrotron Radiation Source +16