J.‐Cl. Dousse

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Jakub Szlachetko, Maarten Nachtegaal, E. de Boni et al. · Review of Scientific Instruments · 2012 · 172 citations · Full text

Physical Mechanisms and Scaling Laws of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-Shell Double Photoionization

J. Hoszowska, A. S. Kheifets, J.‐Cl. Dousse et al. · Physical Review Letters · 2009 · 71 citations

X-ray Spectroscopy, Engineering, Chemistry +16

Systematic study of the yrast band in the doubly-odd 158,160,162,164,166Tm nuclei

S. Drissi, A. Bruder, J.‐Cl. Dousse et al. · Nuclear Physics A · 1986 · 59 citations

Rare Earth Mineral, Systematic Study, Nuclear Physics +7

Performance of a Ge-microstrip imaging detector and polarimeter

U. Spillmann, H. Bräuning, Heinrich Beyer et al. · Review of Scientific Instruments · 2008 · 53 citations

Engineering, Ge-microstrip Imaging Detector, Synchrotron Radiation Source +19

High energy resolution off-resonant spectroscopy at sub-second time resolution: (Pt(acac)2) decomposition

Jakub Szlachetko, Maarten Nachtegaal, Jacinto Sá et al. · Chemical Communications · 2012 · 51 citations