Hema Lata Rao Maddi

Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs

Shengnan Zhu, Limeng Shi, Michael Jin et al. · 2023 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

The Road to a Robust and Affordable SiC Power MOSFET Technology

Hema Lata Rao Maddi, Susanna Yu, Shengnan Zhu et al. · Energies · 2021 · 23 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +16

Effects of Oxide Electric Field Stress on the Gate Oxide Reliability of Commercial SiC Power MOSFETs

Limeng Shi, Tianshi Liu, Shengnan Zhu et al. · 2022 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

Effects of JFET Region Design and Gate Oxide Thickness on the Static and Dynamic Performance of 650 V SiC Planar Power MOSFETs

Shengnan Zhu, Tianshi Liu, Junchong Fan et al. · Materials · 2022 · 15 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Comparison of Gate Oxide Lifetime Predictions with Charge-to-Breakdown Approach and Constant-Voltage TDDB on SiC Power MOSFET

Shengnan Zhu, Tianshi Liu, Limeng Shi et al. · 2021 · 14 citations

Engineering, Electrical Engineering, Materials Science +17