Michael Jin

Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs

Shengnan Zhu, Limeng Shi, Michael Jin et al. · 2023 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation on gate oxide reliability under gate bias screening for commercial SiC planar and trench MOSFETs

Limeng Shi, Jiashu Qian, Michael Jin et al. · Materials Science in Semiconductor Processing · 2024 · 19 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +16

Effects of Oxide Electric Field Stress on the Gate Oxide Reliability of Commercial SiC Power MOSFETs

Limeng Shi, Tianshi Liu, Shengnan Zhu et al. · 2022 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

Comparison of Gate Oxide Lifetime Predictions with Charge-to-Breakdown Approach and Constant-Voltage TDDB on SiC Power MOSFET

Shengnan Zhu, Tianshi Liu, Limeng Shi et al. · 2021 · 14 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs

Limeng Shi, Shengnan Zhu, Jiashu Qian et al. · 2023 · 14 citations

Engineering, Electrical Engineering, Microelectronics +15