Sandeep Dalal

Structural characterization of polycrystalline thin films by X-ray diffraction techniques

Akhilesh Pandey, Sandeep Dalal, Shankar Dutta et al. · Journal of Materials Science Materials in Electronics · 2021 · 192 citations

X-ray Crystallography, Materials Science, X-ray Spectroscopy +8

Aging of distribution cables in service and its simulation in the laboratory

Sandeep Dalal, R.S. Gorur, M.L. Dyer · IEEE Transactions on Dielectrics and Electrical Insulation · 2005 · 56 citations

Industrial Distribution, Electrical Engineering, Reliability Engineering +13

Growth and evolution of residual stress of AlN films on silicon (100) wafer

Akhilesh Pandey, Shankar Dutta, Ravi Prakash et al. · Materials Science in Semiconductor Processing · 2016 · 41 citations

Materials Engineering, Aln Films, Materials Science +8

Effect of two step GaN buffer on the structural and electrical characteristics in AlGaN/GaN heterostructure

Akhilesh Pandey, Vikash Kumar Singh, Sandeep Dalal et al. · Vacuum · 2020 · 41 citations

Electrical Characteristics, Wide-bandgap Semiconductor, Electrical Engineering +7

Effect of fully strained AlN nucleation layer on the AlN/SiC interface and subsequent GaN growth on 4H–SiC by MOVPE

Ruby Khan, Rajesh K. Bag, Kapil Narang et al. · Journal of Materials Science Materials in Electronics · 2019 · 21 citations

Materials Science, Materials Engineering, Aluminium Nitride +7