Improved signal model for confocal sensors accounting for object depending artifacts

Florian Mauch, Wolfram Lyda, Marc Gronle, +1

Optics Express

EngineeringSensor ArrayMeasurementConventional Signal ModelEducation +19

itom: an open source metrology, automation, and data evaluation software

Marc Gronle, Wolfram Lyda, Marc Wilke, +2

Applied Optics

EngineeringMeasurementEducationComputer-aided DesignReal-time Data +26

Advantages of chromatic-confocal spectral interferometry in comparison to chromatic confocal microscopy

Wolfram Lyda, Marc Gronle, David Fleischle, +2

Measurement Science and Technology

EngineeringMicroscopyChromatic-confocal Spectral InterferometryInterferometryChromatic Confocal Microscopy +15

View and sensor planning for multi-sensor surface inspection

Marc Gronle, Wolfgang Osten

Surface Topography Metrology and Properties

Industrial ApplicationsSensor PlanningEngineeringField RoboticsPlanning Process +16

Multi-layer topography measurement using a new hybrid single-shot technique: Chromatic Confocal Coherence Tomography (CCCT)

Tobias Boettcher, Marc Gronle, Wolfgang Osten

Optics Express

EngineeringCoherent Gradient SensingOphthalmologyMedical ImagingMicroscopy +13

Open data for open science in Industry 4.0: In-situ monitoring of quality in additive manufacturing

Marc Gronle, Marco Grasso, Emidio Granito, +2

Journal of Quality Technology

Industrial DesignTechnologyEngineeringIndustrial EngineeringMechanical Engineering +10

Open-source graphics processing unit–accelerated ray tracer for optical simulation

Florian Mauch, Marc Gronle, Wolfram Lyda, +1

Optical Engineering

Optical DesignRealistic RenderingEngineeringComputer Graphic TechniqueComputer Architecture +18

Model-Based Compensation of Dynamic Errors in Measuring Machines and Machine Tools

Alexander Keck, Oliver Sawodny, Marc Gronle, +2

IEEE/ASME Transactions on Mechatronics

Single-shot low coherence pointwise measuring interferometer with potential for in-line inspection

Robin Hahn, Johann Krauter, Klaus Körner, +2

Measurement Science and Technology

Stable Tfm GeometryEngineeringMeasurementMicroscopyOptical Testing +17

Implementation and analysis of an automated multiscale measurement strategy for wafer scale inspection of micro electromechanical systems

Wolfram Lyda, Avinash Burla, Tobias Haist, +2

International Journal of Precision Engineering and Manufacturing

Electrical EngineeringWafer Scale ProcessingEngineeringMicrofabricationMeasurement +12