Dimitris Kontos

Investigation of External Latchup Robustness of Dual and Triple Well Designs in 65nm Bulk CMOS Technology

Dimitris Kontos, K. Domański, Robert Gauthier et al. · 2006 · 25 citations

Electrical Engineering, Engineering, Vlsi Design +9

Backfilling cohorts in phase I dose-escalation studies

Helen Barnett, Oliver Boix, Dimitris Kontos et al. · Clinical Trials · 2023 · 16 citations

On The Interaction of ESD, NBTI and HCI in 65nm Technology

Rahul Mishra, Subhasish Mitra, Robert Gauthier et al. · 2007 · 15 citations

Materials Engineering, Electrical Engineering, Sblk Pfet +15

PMOSFET-based ESD protection in 65nm bulk CMOS technology for improved external latchup robustness

Junjun Li, Robert Gauthier, Kiran Chatty et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2005 · 13 citations

Hardware Security, Silicide-blocked Pmosfets, Electrical Engineering +9

External Latchup Characteristics Under Static and Transient Conditions in Advanced Bulk CMOS Technologies

Dimitris Kontos, Robert Gauthier, Kiran Chatty et al. · 2007 · 11 citations

Hardware Security, Electrical Engineering, Engineering +14