P. Perdu

Backside laser testing of ICs for SET sensitivity evaluation

D. Lewis, V. Pouget, F. Beaudoin et al. · IEEE Transactions on Nuclear Science · 2001 · 85 citations

Engineering, Computer Engineering, Electrical Engineering +13

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

Géraldine Bertrand, C. Delage, M. Bafleur et al. · IEEE Journal of Solid-State Circuits · 2001 · 39 citations

Engineering, Electrical Engineering, Physics +16

Delay variation mapping induced by dynamic laser stimulation

K. Sanchez, R. Deplats, F. Beaudoin et al. · 2005 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16

Optical probing (EOFM / TRI): A large set of complementary applications for ultimate VLSI

P. Perdu, Guillaume Bascoul, Samuel Chef et al. · 2013 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +7

ESD induced latent defects in CMOS ICs and reliability impact

Nicolas Guitard, David Trémouilles, S. Alves et al. · 2004 · 11 citations

Engineering, Electrical Engineering, Analog Electronics +16