Statistics
Publications
2
Citations
23
H-Index
2
Active since
2004
Affiliations
NEC (Japan)(Current)
B. Withers is an author at NEC (Japan).
Publications per year
2004–2019
2
2
High reliability Cu interconnection utilizing a low contamination CoWP capping layer
Takashi Ishigami, T. Kurokawa, Y. Kakuhara et al. · 2004 · 10 citations
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