5
Publications
271
Citations
5
H-Index
1975
Active since
Affiliations
V. A. Ranieri is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, materials engineering, and electromagnetic compatibility.
Top concepts
EngineeringAntennaThin FilmsApplied PhysicsMaterial ScienceMaterials EngineeringElectrical EngineeringElectromagnetic CompatibilityPhysicsCorrosion
Publications per year
1975–2002
5
5
A novel 24-GHz bandwidth coaxial probe
V. A. Ranieri, A. Deutsch, G.V. Kopcsay et al. · IEEE Transactions on Instrumentation and Measurement · 1990 · 24 citations
Electromigration of Ni in Al thin-film conductors
F. M. d’Heurle, A. Gangulee, C. F. Aliotta et al. · Journal of Applied Physics · 1975 · 12 citations
Materials Science, Materials Engineering, Aluminium Nitride +14
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