Apostolos T. Voutsas

Raman spectroscopy of amorphous and microcrystalline silicon films deposited by low-pressure chemical vapor deposition

Apostolos T. Voutsas, Miltiadis K. Hatalis, J. B. Boyce et al. · Journal of Applied Physics · 1995 · 224 citations

Optical Materials, Engineering, Optical Characterization +16

A new era of crystallization: advances in polysilicon crystallization and crystal engineering

Apostolos T. Voutsas · Applied Surface Science · 2003 · 114 citations

Materials Science, Engineering, Crystal Growth Technology +7

Structure of As‐Deposited LPCVD Silicon Films at Low Deposition Temperatures and Pressures

Apostolos T. Voutsas, Miltiadis K. Hatalis · Journal of The Electrochemical Society · 1992 · 105 citations

Materials Engineering, Materials Science, Engineering +13

Assessment of the performance of laser-based lateral-crystallization technology via analysis and modeling of polysilicon thin-film-transistor mobility

Apostolos T. Voutsas · IEEE Transactions on Electron Devices · 2003 · 67 citations

Materials Science, Materials Engineering, Engineering +15

A systematic study and optimization of parameters affecting grain size and surface roughness in excimer laser annealed polysilicon thin films

Aaron Marmorstein, Apostolos T. Voutsas, Raj Solanki · Journal of Applied Physics · 1997 · 60 citations

Engineering, Laser Applications, Optoelectronic Devices +20