W Cox

Degradation of very thin gate oxide MOS devices under dynamic high field/Current stress

Mong-Song Liang, S. Haddad, W Cox et al. · 1986 · 41 citations

Engineering, Electrical Engineering, Materials Science +17

Improved-confinement plasmas at high temperature and high beta in the MST RFP

B. E. Chapman, J.-W. Ahn, A. F. Almagri et al. · Nuclear Fusion · 2009 · 25 citations

Natural Sciences, Physics, Fusion Engineering +14

Charge Trapping in Dielectrics Grown on Polycrystalline Silicon

M.S. Liang, N. Radjy, W Cox et al. · Journal of The Electrochemical Society · 1989 · 17 citations

Engineering, Materials Engineering, Materials Science +17

GaAs SAMP Device for Ku-Band Switching

P.L. Fleming, T. Smith, H.E. Carlson et al. · IEEE Transactions on Microwave Theory and Techniques · 1979 · 16 citations

Engineering, Electrical Engineering, Microelectronics +16

Experimental investigation of a conical helicon double layer thruster arrangement

Christine Charles, W Cox, Rod Boswell et al. · Plasma Sources Science and Technology · 2010 · 10 citations

Natural Sciences, Physics, Electromagnetics +15