Concepedia

Author

D. Montaner

Centre National de la Recherche Scientifique

Also Known As

D Montaner, D. Montaner, Denis Montaner, Montaner, D., Montaner, Denis, Myung K. Kim

47

Publications

246

Citations

9

H-Index

55

Concepts

All Affiliations

Centre National de la Recherche ScientifiqueLaboratoire des Sciences de l'Ingénieur, de l'Informatique et de l'Imagerie
DM

About

D. Montaner is an author at Centre National de la Recherche Scientifique specializing in engineering, microscopy, and applied physics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

8

8

178

2

Medicine

3

3

48

3

Education

2

2

57

4

Health Sciences

1

1

16

5

Natural Sciences

1

1

14

D. Montaner

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9

Publications

191

Citations

9

H-Index

YearCitations

White Light Scanning Interferometry Adapted for Large-Area Optical Analysis of Thick and Rough Hydroxyapatite Layers

E. Pecheva, P.C. Montgomery, D. Montaner,

Langmuir

2007

43

The metrology of a miniature FT spectrometer MOEMS device using white light scanning interference microscopy

Paul Montgomery, D. Montaner, Omar Manzardo,

Thin Solid Films

2004

35

Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement

Paul Montgomery, F. Salzenstein, D. Montaner,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2013

22

Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy

Éric Halter, Paul Montgomery, D. Montaner,

Applied Surface Science

2010

17

Phase-stepping microscopy (PSM): a qualification tool for electronic and optoelectronic devices

Paul Montgomery, J.P. Fillard, M. Castagné,

Semiconductor Science and Technology

1992

17

Tomographic analysis of medium thickness transparent layers using white light scanning interferometry and XZ fringe image processing

Paul Montgomery, D. Montaner, F. Salzenstein

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2012

16

Deep submicron 3D surface metrology for 300 mm wafer characterization using UV coherence microscopy

Paul Montgomery, D. Montaner

Microelectronic Engineering

1999

14

Depth-resolved local reflectance spectra measurements in full-field optical coherence tomography

Rémy Claveau, Paul Montgomery, Manuel Flury,

Optics Express

2017

14

Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

F. Salzenstein, Paul Montgomery, D. Montaner,

EURASIP Journal on Advances in Signal Processing

2005

13

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