D. Montaner

White Light Scanning Interferometry Adapted for Large-Area Optical Analysis of Thick and Rough Hydroxyapatite Layers

E. Pecheva, P.C. Montgomery, D. Montaner et al. · Langmuir · 2007 · 43 citations

Tissue Engineering, Optical Materials, Engineering +23

The metrology of a miniature FT spectrometer MOEMS device using white light scanning interference microscopy

Paul Montgomery, D. Montaner, Omar Manzardo et al. · Thin Solid Films · 2004 · 35 citations · Full text

Precision Measurement, Engineering, Analytical Instrumentation +10

Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement

Paul Montgomery, F. Salzenstein, D. Montaner et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 22 citations

Engineering, Measurement, Optical Testing +17

Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy

Éric Halter, Paul Montgomery, D. Montaner et al. · Applied Surface Science · 2010 · 17 citations

Colloidal Material, Engineering, Microscopy +10

Phase-stepping microscopy (PSM): a qualification tool for electronic and optoelectronic devices

Paul Montgomery, J.P. Fillard, M. Castagné et al. · Semiconductor Science and Technology · 1992 · 17 citations

Optical Materials, Engineering, Microscopy +22