P. Goarin

Split-gate Resurf Stepped Oxide (RSO) MOSFETs for 25V applications with record low gate-to-drain charge

P. Goarin, G.E.J. Koops, R. van Dalen et al. · 2007 · 100 citations

Electrical Engineering, Engineering, Power Device +9

Performance and Reliability Features of Advanced Nonvolatile Memories Based on Discrete Traps (Silicon Nanocrystals, SONOS)

B. DeSalvo, C. Gerardi, R. vanSchaijk et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 89 citations

Non-volatile Memory, Electrical Engineering, Engineering +13

Performance and Reliability of 2-Transistor FN/FN Flash Arrays with Hafnium Based High-K Inter-Poly Dielectrics for Embedded NVM

M. van Duuren, R. van Schaijk, M. Slotboom et al. · 2006 · 11 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +19

Power Trench MOSFETs with very low specific on-resistance for 25V applications

P. Goarin, R. van Dalen, G.E.J. Koops et al. · Solid-State Electronics · 2007 · 10 citations

Low-power Electronics, Electrical Engineering, Engineering +7