Statistics
Publications
7
Citations
371
H-Index
7
Active since
1975
Affiliations
J. Topalian is an author at IBM Research - Thomas J. Watson Research Center specializing in x-ray lithography, materials science, and natural sciences.
Publications per year
1975–1979
7
7
High-Resolution Soft X-Ray Microscopy
R. Feder, Eberhard Spiller, J. Topalian et al. · Science · 1977 · 91 citations
Application of synchrotron radiation to x-ray lithography
Eberhard Spiller, D. E. East̀man, R. Feder et al. · Journal of Applied Physics · 1976 · 75 citations
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