Rita Fung

An SEU-Tolerant DICE Latch Design With Feedback Transistors

Haibin Wang, Y.-Q. Li, Li Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +15

Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs

Qiong Wu, Yuan‐Qing Li, Li Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 35 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology

Haibin Wang, Li Chen, R. Liu et al. · IEEE Transactions on Nuclear Science · 2016 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +15

Single-Event Latchup in a 7-nm Bulk FinFET Technology

Dennis R. Ball, C. B. Sheets, Lyuan Xu et al. · IEEE Transactions on Nuclear Science · 2021 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +11

Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Haibin Wang, N. N. Mahatme, Li Chen et al. · IEEE Transactions on Nuclear Science · 2016 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +16