Lutz Bruegemann

Structural Characterization of BiFeO₃ Thin Films by Reciprocal Space Mapping

Keisuke Saito, A. Ulyanenkov, Volkmar Grossmann et al. · Japanese Journal of Applied Physics · 2006 · 83 citations

Engineering, Bifeo3 Thin Films, Thin Film Process Technology +16

Combining SAXS and DLS for simultaneous measurements and time-resolved monitoring of nanoparticle synthesis

Alexander Schwamberger, Bert De Roo, David S. Jacob et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2014 · 59 citations

Nanoparticles, Chemical Engineering, Engineering +9

<title>Laterally graded multilayer optics for x-ray analysis</title>

M. Schuster, H. Goebel, Lutz Bruegemann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 39 citations

Optical Materials, Engineering, Microscopy +18

<title>Multilayer x-ray optics for energies E > 8 keV and their application in x-ray analysis</title>

Reiner Dietsch, Stefan Braun, Thomas Holz et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 14 citations

Optical Materials, X-ray Spectroscopy, Engineering +19