Miyuki Matsuya

Aberration correction and its automatic control in scanning electron microscopes

Shinobu Uno, Kazuhiro Honda, Natsuko Nakamura et al. · Optik · 2005 · 28 citations

Engineering, Electron Microscopy, Ophthalmology +10

Development of laser ionization mass nanoscope (LIMAS)

Shingo Ebata, Morio Ishihara, Kiichiro Uchino et al. · Surface and Interface Analysis · 2012 · 25 citations

Accelerator Mass Spectrometry, Physics, Primary Ion Beam +13

Field Emission SEM with a Spherical and Chromatic Aberration Corrector

H. Kazumori, Kazuhiro Honda, Miyuki Matsuya et al. · Microscopy and Microanalysis · 2004 · 18 citations

Optical Materials, Engineering, Microscopy +18

High spatial resolution imaging of helium isotope by TOF‐SNMS

Ken‐ichi Bajo, Satoru Itose, Miyuki Matsuya et al. · Surface and Interface Analysis · 2016 · 18 citations

High Resolution, Engineering, Nuclear Physics +20

Aberration-corrected focused ion beam for time-of-flight secondary neutral mass spectrometry

Kosuke Nagata, Ken‐ichi Bajo, Satoru Itose et al. · Applied Physics Express · 2019 · 12 citations · Full text