Mohammed H. Tayarani-Najaran

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Active since

1991

Affiliations

Mohammed H. Tayarani-Najaran is an author at University of Bradford specializing in electronic density of states, materials science, and semiconductor interfaces.

Publications per year

1991–1992

Publications

Measured intrinsic defect density throughout the entire band gap at the <100> Si/SiO<sub>2</sub>interface

David Sands, Kevin M. Brunson, Mohammed H. Tayarani-Najaran · Semiconductor Science and Technology · 1992 · 27 citations

Natural Sciences, Materials Science, Physics +17

Conductance technique measurements of the density of interface states between ZnS:Mn and <i>p</i>-silicon

Andrew J. Simons, Mohammed H. Tayarani-Najaran, Clive B. Thomas · Journal of Applied Physics · 1991 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

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