Arthur Nieuwoudt

Expression of Concern: Evaluating the impact of resistance in carbon nanotube bundles for VLSI interconnect using diameter-dependent modeling techniques

Arthur Nieuwoudt, Yehia Massoud · IEEE Transactions on Electron Devices · 2006 · 161 citations

Engineering, Vlsi Design, Carbon Nanotube Bundles +18

Expression of Concern: Understanding the Impact of Inductance in Carbon Nanotube Bundles for VLSI Interconnect Using Scalable Modeling Techniques

Arthur Nieuwoudt, Yehia Massoud · IEEE Transactions on Nanotechnology · 2006 · 124 citations

Device Modeling, Inductance Model, Electrical Engineering +15

Expression of Concern: On the Optimal Design, Performance, and Reliability of Future Carbon Nanotube-Based Interconnect Solutions

Arthur Nieuwoudt, Yehia Massoud · IEEE Transactions on Electron Devices · 2008 · 120 citations

Engineering, Mechanical Engineering, Interconnect (Integrated Circuits) +16

Modeling and design challenges and solutions for carbon nanotube-based interconnect in future high performance integrated circuits

Yehia Massoud, Arthur Nieuwoudt · ACM Journal on Emerging Technologies in Computing Systems · 2006 · 117 citations

Future High Performance, Swcnt Chirality, Engineering +22

Expression of Concern: On the Impact of Process Variations for Carbon Nanotube Bundles for VLSI Interconnect

Arthur Nieuwoudt, Yehia Massoud · IEEE Transactions on Electron Devices · 2007 · 94 citations

Carbon Nanotube Bundles, Engineering, Single-walled Carbon Nanotubes +20