Kazuhiro Hane

Broadband antireflection gratings fabricated upon silicon substrates

Yoshiaki Kanamori, Masahide Sasaki, Kazuhiro Hane · Optics Letters · 1999 · 434 citations

A method for determining the spring constant of cantilevers for atomic force microscopy

Akihiro Torii, Minoru Sasaki, Kazuhiro Hane et al. · Measurement Science and Technology · 1996 · 281 citations

Atomic Force Microscopy, Engineering, Microscopy +18

100 nm period silicon antireflection structures fabricated using a porous alumina membrane mask

Yoshiaki Kanamori, Kazuhiro Hane, Hitoshi Sai et al. · Applied Physics Letters · 2001 · 259 citations

Engineering, Electron-beam Lithography, Silicon On Insulator +18

Local mechanical properties measured by atomic force microscopy for cultured bovine endothelial cells exposed to shear stress

Masaaki Sato, Kunihito Nagayama, Noriyuki Kataoka et al. · Journal of Biomechanics · 2000 · 251 citations

Mechanobiology, Tissue Engineering, Atomic Force Microscopy +13

Fabrication of Transmission Color Filters Using Silicon Subwavelength Gratings on Quartz Substrates

Yoshiaki Kanamori, Masaya Shimono, Kazuhiro Hane · IEEE Photonics Technology Letters · 2006 · 177 citations

Photonic Sensor, Optical Materials, Engineering +17