A. H. Weiss

Surface Roughness of Water Measured by X-Ray Reflectivity

Alan Braslau, Moshe Deutsch, P. S. Pershan et al. · Physical Review Letters · 1985 · 417 citations · Full text

X-ray Spectroscopy, Engineering, X-ray Reflectivity +16

Auger-Electron Emission Resulting from the Annihilation of Core Electrons with Low-Energy Positrons

A. H. Weiss, R. Mayer, M. Jibaly et al. · Physical Review Letters · 1988 · 147 citations

Engineering, Physics, Positron Annihilation Spectroscopy +14

Smectic layering at the free surface of liquid crystals in the nematic phase: X-ray reflectivity

P. S. Pershan, Alan Braslau, A. H. Weiss et al. · Physical review. A, General physics · 1987 · 144 citations · Full text

X-ray Crystallography, Engineering, X-ray Reflectivity +16

Low-Energy Positron Diffraction from a Cu(111) Surface

I. J. Rosenberg, A. H. Weiss, K. F. Canter · Physical Review Letters · 1980 · 99 citations

Materials Science, Surface Characterization, Engineering +14

Electrodeposition and Characterization of SnS Thin Films

Kamal K. Mishra, Krishnan Rajeshwar, A. H. Weiss et al. · Journal of The Electrochemical Society · 1989 · 94 citations

Engineering, Chemistry, Chemical Engineering +16