H. Bengel

Structural and scanning microscopy studies of layered compounds MCl3 (M = Mo, Ru, Cr) and MOCl2 (M = V, Nb, Mo, Ru, Os)

Harald Hillebrecht, Peter J. Schmidt, H. Rotter et al. · Journal of Alloys and Compounds · 1997 · 86 citations

Materials Science, Inorganic Chemistry, Layered Compounds Mcl3 +6

On the correlation between the scanning tunneling microscopy image imperfections and point defects of layered chalcogenides 2HMX2 (M = Mo, W; X = S, Se)

Myung‐Hwan Whangbo, Jun Ren, S. N. Magonov et al. · Surface Science · 1995 · 44 citations

Thin Single Crystals of Organic Insulators, Metals, and Superconductors by Confined Electrocrystallization

André Deluzet, Sandrine Perruchas, H. Bengel et al. · Advanced Functional Materials · 2002 · 36 citations · Full text

Engineering, Electrode-electrolyte Interface, Organic Electronics +21

Nature of the charge density wave images of layered tantalum dichalcogenides 1T-TaX2 (X = sulfur, selenium) in scanning tunneling and atomic force microscopy

M.-H. Whangbo, Jun Ren, Enric Cañadell et al. · Journal of the American Chemical Society · 1993 · 36 citations

Atomic Force Microscopy, Engineering, Altmetric Attention Score +16

Tip-force induced surface deformation in the layered commensurate tellurides NbAxTe2 (A = Si, Ge) during atomic force microscopy measurements

H. Bengel, H.‐J. Cantow, Sergei Magonov et al. · Surface Science · 1994 · 29 citations

Materials Science, Surface Deformation, Surface Characterization +10