F. Streicher

The influence of surface topography on Kelvin probe force microscopy

Sascha Sadewasser, Caspar Leendertz, F. Streicher et al. · Nanotechnology · 2009 · 53 citations

Engineering, Microscopy, Education +17

Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films

Caspar Leendertz, F. Streicher, M. Lux‐Steiner et al. · Applied Physics Letters · 2006 · 42 citations · Full text

Engineering, Microscopy, Real Potential Drop +19

Structure of InAs/GaAs quantum dots grown with Sb surfactant

Rainer Timm, H. Eisele, A. Lenz et al. · Physica E Low-dimensional Systems and Nanostructures · 2006 · 35 citations

Engineering, Physics, Sb Surfactant +4

Surface photovoltage spectroscopy in a Kelvin probe force microscope under ultrahigh vacuum

F. Streicher, Sascha Sadewasser, Martha Ch. Lux‐Steiner · Review of Scientific Instruments · 2009 · 34 citations

Engineering, Ultrahigh Vacuum, Microscopy +22

Combined analysis of spatially resolved electronic structure and composition on a cross‐section of a thin film Cu(In_1–<i>x</i>Ga<i>_x</i>)S₂ solar cell

Roland Mainz, F. Streicher, Daniel Abou‐Ras et al. · physica status solidi (a) · 2009 · 24 citations

Cross Section, Engineering, Thin Film Process Technology +18