Tianxiang Yan

Dielectric relaxation behavior and mechanism of Y 2/3 Cu 3 Ti 4 O 12 ceramic

Jianming Deng, Laijun Liu, Xiaojun Sun et al. · Materials Research Bulletin · 2017 · 100 citations

Materials Science, Engineering, Ti 4 +6

High-temperature dielectric and relaxation behavior of Yb-doped Bi 0.5 Na 0.5 TiO 3 ceramics

Feifei Han, Jianming Deng, Xiaoqi Liu et al. · Ceramics International · 2017 · 83 citations

Materials Science, Relaxation Behavior, Engineering +7

Influence of interface point defect on the dielectric properties of Y doped CaCu₃Ti₄O12 ceramics

Jianming Deng, Xiaojun Sun, Saisai Liu et al. · Journal of Advanced Dielectrics · 2016 · 71 citations · Full text

Engineering, Ceramic Powders, Electrical Properties +16

Grain boundary defect compensation in Ti-doped BaFe0.5Nb0.5O3 ceramics

Xiaojun Sun, Jianming Deng, Saisai Liu et al. · Applied Physics A · 2016 · 47 citations

Materials Engineering, Materials Science, Engineering +2

High temperature dielectrics and defect characteristic of (Nb, Mn, Zr) modified 0.4(Ba 0.8 Ca 0.2 )TiO 3 – 0.6Bi(Mg 0.5 Ti 0.5 )O 3 ceramics

Shaokai Ren, Zhi Chen, Tianxiang Yan et al. · Journal of Physics and Chemistry of Solids · 2018 · 43 citations

Materials Science, Ti 0.5, Electrical Engineering +8