Alberto Maria Angelotti

Experimental Characterization of Charge Trapping Dynamics in 100-nm AlN/GaN/AlGaN-on-Si HEMTs by Wideband Transient Measurements

Alberto Maria Angelotti, Gian Piero Gibiino, Alberto Santarelli et al. · IEEE Transactions on Electron Devices · 2020 · 32 citations · Full text

Wide-bandgap Semiconductor, Engineering, Charge Trapping Dynamics +16

Broadband Error Vector Magnitude Characterization of a GaN Power Amplifier using a Vector Network Analyzer

Alberto Maria Angelotti, Gian Piero Gibiino, Corrado Florian et al. · 2020 · 24 citations · Full text

Wideband Linearity, Electrical Engineering, Engineering +9

Wideband Active Load–Pull by Device Output Match Compensation Using a Vector Network Analyzer

Alberto Maria Angelotti, Gian Piero Gibiino, Troels S. Nielsen et al. · IEEE Transactions on Microwave Theory and Techniques · 2020 · 22 citations · Full text

Electrical Engineering, Gallium Nitride, Engineering +13

Trapping Dynamics in GaN HEMTs for Millimeter-Wave Applications: Measurement-Based Characterization and Technology Comparison

Alberto Maria Angelotti, Gian Piero Gibiino, Corrado Florian et al. · Electronics · 2021 · 20 citations · Full text

Device Modeling, Technology Comparison, Electrical Engineering +15

Microwave Characterization of Trapping Effects in 100-nm GaN-on-Si HEMT Technology

Gian Piero Gibiino, Alberto Maria Angelotti, Alberto Santarelli et al. · IEEE Microwave and Wireless Components Letters · 2019 · 19 citations

Dynamic Trap Behavior, Wide-bandgap Semiconductor, Electrical Engineering +13