K. Anno

Structure analysis of the single-domain Si(111)4 × 1-In surface by μ-probe Auger electron diffraction and μ-probe reflection high energy electron diffraction

N. Nakamura, K. Anno, S. Kono · Surface Science · 1991 · 52 citations

Surface Characterization, Engineering, Physics +6

Reinvestigation of the Structure of Si(111) √3 × √3-Ag Surface

Shozo Kono, T. Abukawa, Natsuo Nakamura et al. · Japanese Journal of Applied Physics · 1989 · 26 citations

Materials Science, Surface Characterization, Engineering +12

Study of the surface electromigration of In on Si(111) surfaces by the use of micro-electron-beams

K. Anno, N. Nakamura, Shinji Kono · Surface Science · 1992 · 18 citations

Surface Characterization, Electromigration Technique, Engineering +11

A new method of surface structure-analysis by medium energy electron diffraction: distinction between T4 and H3 models for the Si(111)√3 × √3 -In surface

N. Nakamura, K. Anno, S. Kono · Surface Science · 1992 · 18 citations

Materials Science, Surface Characterization, H3 Models +7

Developments of a surface-analysis apparatus and techniques using micro-probe electron beams

S. Kono, N. Nakamura, K. Anno et al. · Surface Science · 1992 · 17 citations

Engineering, Electron Microscopy, Physics +8