T. Abukawa

Photoelectron diffraction study of Si(001) 2 × 1-K surface: Existence of a potassium double layer

T. Abukawa, S. Kono · Physical review. B, Condensed matter · 1988 · 205 citations

X-ray Spectroscopy, Engineering, Electron Diffraction +21

Surface electronic structure of a single-domain Si(111)4 × 1-In surface: a synchrotron radiation photoemission study

T. Abukawa, Makoto Sasaki, F. Hisamatsu et al. · Surface Science · 1995 · 140 citations

Surface Characterization, × 1-In Surface, Engineering +6

Low Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of the Formation of Submonolayer Interfaces of Sb/Si(111)

Chong-Yun Park, T. Abukawa, T. Kinoshita et al. · Japanese Journal of Applied Physics · 1988 · 87 citations

Materials Science, Semiconductors, Surface Characterization +14

Angle-scanned photoelectron diffraction

Jürg Osterwalder, P. Aebi, Román Fasel et al. · Surface Science · 1995 · 67 citations

Engineering, Applied Physics, Angle-scanned Photoelectron Diffraction +4

Photoelectron diffraction study of the atomic geometry of the Si(111)√3×√3-Sb surface

T. Abukawa, C.Y. Park, Susumu Kôno · Surface Science · 1988 · 64 citations

Materials Science, Surface Characterization, Engineering +9